A-E Electronics









Acronyms

      ANSI - American National Standards Institute
      ANSI/J-STD-0001 - Requirements for Soldered Electrical and Electronic Assemblies
      AOI - Automatic Optical Inspection
      AS 9100 - Aerospace Standard - Quality Management Systems – Requirements
      ATP - Acceptance Test Procedure
      BGA - Ball Greed Array
      BSDL - Boundary Scan Description Language
      CAD - Computer Added Design
      CNC - Computer Numerical Control
      DBR - Drum-Buffer-Rope
      DFT - Design For Testability
      EEPROM - Electrically Erasable Programmable Read-Only Memory
      EPGA - Embedded Programmable Gate Array
      ERP - Enterprise Resource Planning
      ESD - Electro-Static Discharge
      ESS - Environmental Stress Screening
      FAI - First Article Inspection
      FPGA - Field Programmable Gate Array
      GPIB - General Purpose Interface Bus
      ICT - In-Circuit Testing
      IPC - Institute for Printed Circuits
      IPC 610 - Acceptability of Electronic Assemblies
      IPC 620 - Requirements and Acceptance for Cables and Wire Harnesses Assemblieis
      ISP - In-System Programmable
      JTAG - Joint Test Action Group
      LRU - Line Replaceable Unit (integrated product)
      MPT - Multi-Point Tester
      PCB - Printed Circuit Board
      PLD - Programmable Logic Device
      PLM - Product Lifecycle Management
      PWA - Printed Wiring Assembly
      RF - Radio Frequency
      RFP - Request For Proposal
      RFQ - Request For Quotation
      SMT - Surface Mounted Technology
      SRU - Shop Replaceable Unit (assembled PWA)
      TH - Through-Hole
      UUT - Unit Under Test

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