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Acronyms
- ANSI - American National Standards Institute
- ANSI/J-STD-0001 - Requirements for Soldered Electrical and Electronic Assemblies
- AOI - Automatic Optical Inspection
- AS 9100 - Aerospace Standard - Quality Management Systems – Requirements
- ATP - Acceptance Test Procedure
- BGA - Ball Greed Array
- BSDL - Boundary Scan Description Language
- CAD - Computer Added Design
- CNC - Computer Numerical Control
- DFT - Design For Testability
- EEPROM - Electrically Erasable Programmable Read-Only Memory
- EPGA - Embedded Programmable Gate Array
- ERP - Enterprise Resource Planning
- ESD - Electro-Static Discharge
- ESS - Environmental Stress Screening
- FAI - First Article Inspection
- FPGA - Field Programmable Gate Array
- GPIB - General Purpose Interface Bus
- ICT - In-Circuit Testing
- IPC - Institute for Printed Circuits
- IPC 610 - Acceptability of Electronic Assemblies
- IPC 620 - Requirements and Acceptance for Cables and Wire Harnesses Assemblieis
- ISP - In-System Programmable
- JTAG - Joint Test Action Group
- LRU - Line Replaceable Unit (integrated product)
- MPT - Multi-Point Tester
- PCB - Printed Circuit Board
- PLD - Programmable Logic Device
- PLM - Product Lifecycle Management
- PWA - Printed Wiring Assembly
- RFP - Request For Proposal
- RFQ - Request For Quotation
- SMT - Surface Mounted Technology
- SRU - Shop Replaceable Unit (assembled PWA)
- TH - Through-Hole
- UUT - Unit Under Test
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